Eyepieces | 10X/22mm, 15X/17mm, 20X/14mm, 30X/9mm |
---|---|
Field of View | Φ14, Φ17, Φ22mm, Φ9 |
Illuminator | LED coaxial illumination, MLR25 ring illuminator |
Interpupillary Distance | 52mm~76mm |
Focus Holder | SF10 Fine-coarse Focus |
Optical Mag. | 11X~75X(10X eyepieces) |
Zoom Ratio | 6.8:1 |
Working Distance | 73mm |
Viewing Angle | 45° |
Stand | SD11J-D |
Specification | Details |
---|---|
Visual Magnification | 11X~75X (with WF10X/22 eyepieces), maximum magnification of 450X (with 30X eyepiece) |
Continuous Zoom Range | 1.1X~7.5X |
Working Distance | 73mm |
Eyepiece Tube | Binocular eyepiece tube with 45° inclination |
Light Source | Adjustable high-brightness, long-lifetime LED coaxial illumination |
Interpupillary Adjustment Range | 52mm~76mm |
Diopter Adjustment Range | ±6 diopters |
Mounting Size | Φ45mm |
● MZDB1175B & MZDB11758TC eyepieces observation
Eyepieces | Items | Optical Specification |
10X/Φ22 | Total Mag. | 11X~75X |
FOV(mm) | Φ20~Φ2.93 | |
15X/Φ17 | Total Mag. | 16.5X~112.5X |
FOV(mm) | Φ15.45~Φ2.27 | |
20X/Φ14 | Total Mag. | 22X~150X |
FOV(mm) | Φ12.73~Φ1.87 | |
30X/Φ9 | Total Mag. | 33X~225X |
FOV(mm) | Φ8.18~Φ1.2 | |
WD(mm) | 73 | |
Zoom body magnification range 1.1X~7.5X |
● MZDB11758TC Video Display
Items | CCD adapter | |
0.5X | 1X | |
Total Mag. | 0.55X~3.75X | 1.1X~7.5X |
FOV(mm) | 6.55X8.73~0.96X1.28 | 3.27X4.36~0.48X0.64 |
WD(mm) | 73 | |
Zoom body magnification range 1.1X~7.5X |
For MZDB1175BTC trinocular, when combined with a CCD camera, magnification can be extended to even higher levels on the display screen.
Camera magnification is determined by both the camera’s sensor size and the monitor size.
The larger the display and sensor, the higher magnification you can get without sacrificing clarity.
Sensor Size | Monitor Size (Diagonal) | Magnification on Monitor |
---|---|---|
1/3″ | 9″ (228.6mm) | 38.1X |
1/2″ | 12″ (304.8mm) | 50.7X |
2/3″ | 13″ (337.8mm) | 30.0X |
1″ | 24″ (606.9mm) | 101.2X |
For example, with 1/2″ camera and 12″ screen, the magnification is 50.7X.
On MZDB1175BTC, the final mag. can reach 380X with 73mm working distance.
Model | MZDB1175B+SD11J-D | MZDB1175B+SD11J-D |
Photo | ||
Microscope head | binocular | trinocular with a video interface |
Eyepieces | 10X/22mm | 10X/22mm |
CCD adaptor | N/A | C1.0(1.0X) |
Auxiliary objective | DB-W1.0 (WD: 73mm) | DB-W1.0 (WD: 73mm) |
Coaxial Illumination | MLC1000 | MLC1000 |
Stand | SD11-D | SD11-D |
Coarse-fine Focus Mount | SF10 | SF10 |
| Stands | SD1-D~SD18-D |
| Eyepieces | 10X, 15X, 20X, 30X |
| Divisional eyepieces | 10X, 15X, 20X |
micrometers | CM0.1X, CM0.1XY, CMS0.2 | |
| Auxiliary objectives | DB-W2.0 |
| CCD adapters | C0.5-S、C1.0-S |
| Digital camera adapter | DT01 |
| Digital camera adapter | PT02 |
| 1X CCD adapter with micrometer | CDM1.0 Note: It should be used with CCD adapter together. |
| Mechanical stage | S7665, S10086 |
1 | Application Category | Specific Application Examples | Benefits of MZDB1175 (BC/BTC) | Benefits Specific to MZDB1175BTC (Trinocular) |
2 | General Quality Control/Inspection | – Incoming material inspection – In-process inspection – Final product inspection | – High contrast coaxial illumination reveals subtle defects. – Clear, sharp images for accurate assessment. – Wide magnification range for various inspection needs. | – Image/video capture for documentation and archiving. – Facilitates training and collaboration. |
3 | Manufacturing | – Assembly verification – Post-production inspection – Tool and die inspection | – Precise inspection of small parts and assemblies. – Coaxial illumination ideal for reflective surfaces. – Durable construction for industrial environments. | – Integration with automated inspection systems possible. – Real-time image sharing for consultation. |
4 | Research & Development | – Material science research – Biological sample analysis – Failure analysis | – High-quality imaging for detailed analysis. – Versatile configuration with various accessories. – Suitable for diverse research applications. | – Enables advanced microscopy techniques with camera attachments. – Supports image analysis software for quantitative data. |
5 | Electronics Inspection | – PCB inspection (solder joints, components) – Microchip inspection – Connector inspection | – Coaxial illumination minimizes glare on reflective components. – High magnification for detailed inspection of microstructures. – Suitable for inspecting fine pitch components. | – Image capture for documentation and traceability. – Ideal for training technicians on inspection procedures. |
6 | Metallurgy | – Microstructure analysis – Grain size determination – Defect detection in metals | – Coaxial illumination reveals etched microstructures clearly. – High contrast imaging for accurate analysis of grain boundaries. – Robust design suitable for laboratory environments. | – Enables photomicrography for documentation and research publications. – Supports image analysis for quantitative metallurgical analysis. |
7 | Forensics | – Fiber analysis – Trace evidence examination – Ballistics examination | – High contrast illumination reveals fine details on small samples. – Precise magnification for accurate measurements. – Durable and reliable for forensic laboratory use. | – Image/video documentation for evidence preservation. – Facilitates presentation of evidence in court. |
8 | Deep Hole Inspection | – Inspection of drilled holes – Inspection of machined cavities | – Coaxial illumination provides even lighting at the bottom of deep holes. – Clear visualization of defects and features within the hole. | – Image capture for quality control records. – Enables remote inspection via camera and monitor. |
9 | LCD/Display wafer Inspection | – Pixel defect detection< – Scratch and contamination inspection – Backlight uniformity assessment | – Coaxial illumination minimizes glare and reflections from reflective surfaces. – High contrast imaging reveals subtle defects on displays. – Suitable for various display technologies. | – Image capture for defect documentation and analysis. – Enables automated defect detection systems. |
10 | Printed Materials Inspection | – PCB inspection (printing defects, registration) – Label inspection – Packaging inspection | – Coaxial illumination reveals printing errors and imperfections. – Consistent lighting across the surface of the printed material. – Suitable for various printing techniques. | – Image capture for quality control and process improvement. – Facilitates automated optical inspection (AOI) systems. |
11 | Highly Reflective Surfaces | – Polished metal parts – Mirrors – Optical components | – Minimizes glare and hot spots, providing even illumination. – Reveals surface details that would be obscured with traditional lighting. | – Enables high-quality image capture for analysis and documentation. – Suitable for automated inspection of reflective parts. |
12 | Items with Mixed Reflectivity | – Electronic assemblies with both reflective and matte components – Samples with varying surface textures | – Provides balanced illumination, revealing details in both highly reflective and non-reflective areas. – Eliminates shadows and uneven lighting. | – Allows for comprehensive image capture of complex samples. – Facilitates analysis of different surface types within the same image. |
1 | Application | Recommended Model | Key Considerations |
2 | General Quality Control/Inspection (Basic Visual) | MZDB1175BC (Binocular) | For simple visual checks without the need for image capture or documentation. Cost-effective solution. |
3 | General Quality Control/Inspection (With Documentation/Collaboration) | MZDB1175BTC (Trinocular) | For applications requiring image/video capture, reporting, training, or collaboration. |
4 | Electronics Inspection (PCB, Components, Solder Joints) | MZDB1175BTC (Trinocular) | High magnification and image capture are crucial for detailed electronics inspection. Coaxial illumination minimizes glare on reflective components. |
5 | Metallurgy (Microstructure Analysis) | MZDB1175BTC (Trinocular) | Essential for photomicrography and quantitative analysis of metallurgical samples. Coaxial illumination reveals etched microstructures clearly. |
6 | Small Deep Hole & Wafer Inspection | MZDB1175BTC (Trinocular) | The coaxial illumination and trinocular port for image capture are highly beneficial for these applications, allowing for detailed inspection and documentation of defects. |
7 | Printed Materials Inspection (Detailed Analysis) | MZDB1175BTC (Trinocular) | For detailed analysis and documentation of printing defects, the trinocular model is recommended. |
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