Struggling to inspect reflective surfaces on your probe station? > Our MTO MZDH15100 series is a professional Coaxial Illumination Zoom Microscope designed for high-end micro-inspection. It delivers an ultra-high resolution imaging system that supports simultaneous video display and visual observation. With a standard 15X–100X zoom (expandable to 1350X) and a patented 82mm long working distance, it is the ultimate solution for semiconductor and wafer analysis.
| Eyepieces | 10X/23mm |
|---|---|
| Viewing Angle | 45° |
| Field of View | φ23mm |
| Optical Mag. | 15X~100X(10X E) |
| Zoom Ratio | 6.7:1 |
| Working Distance | 82mm |
| Illuminator | LED coaxial illumination |
| Focus Holder | SF10 Fine-coarse Focus |
| Mounting Size | φ45mm |
Original Optical Design: High-magnification and high-resolution imaging specifically for microcosmic surfaces.
Simultaneous Observation: Supports video display, digital photography, and binocular visual observation at the same time.
Patented Coaxial Illumination: Built-in LED coaxial light source provides high-contrast imaging on reflective components.
Large Zoom Ratio: A 6.7:1 zoom ratio (1.5X to 10X) ensures seamless magnification transition.
Erect Image System: Binocular eyetubes provide an intuitive, non-reversed image for easier probe manipulation.
Ideal for probe stations for the features:
Except for probe station, it is also perfect for any other inspection on the objects which requires the conditions as above.
| Eyepieces observing Magnification | 15X~100X(10X eyepieces) observation total magnification:15X~100X. |
| Zoom range | 1.5X~10X |
| Working Distance | 82mm |
| Eyetubes | 45°/Binocular eyetubes indined45° |
| Illuminators | Long life,various color,high brightness LED coaxial illumination(optional polarizer) |
| Interpupillary distance adjustment range | 52mm~76mm |
| Diopter adjustment range | ±6 Diopter |
| Focus range | Hand wheel:50mm.height of round pole is 242mm. |
| Holder and main body matching dimension | D45mm |
| Eyepieces | Item | Main body | Auxiliary Objectives | ||||
| 0.5X | 0.75X | 1.5X | 2X | 4.5X | |||
| 10X/Φ22 | Total Mag. | 15X~100X | 7.5X~50X | 11.25X~75X | 22.5X~150X | 30X~200X | 67.5X~450X |
| FOV(mm) | Φ14.67~Φ2.2 | Φ29.33~Φ4.4 | Φ19.56~Φ2.93 | Φ9.78~Φ1.47 | Φ7.33~Φ1.1 | Φ3.25~Φ0.49 | |
| 15X/Φ17 | Total Mag. | 22.5X~150X | 11.25X~75X | 16.875X~112.5X | 33.75X~225X | 45X~300X | 101.3X~675X |
| FOV(mm) | Φ11.33~Φ1.7 | Φ22.67~Φ3.4 | Φ15.11~Φ2.27 | Φ7.56~Φ1.13 | Φ5.67~Φ0.85 | Φ2.52~Φ0.38 | |
| 20X/Φ14 | Total Mag. | 30X~200X | 15X~100X | 22.5X~150X | 45X~300X | 60X~400X | 135X~900X |
| FOV(mm) | Φ9.33~Φ1.4 | Φ18.67~Φ2.8 | Φ12.44~Φ1.87 | Φ6.22~Φ0.93 | Φ4.67~Φ0.7 | Φ2.07~Φ0.31 | |
| 30X/Φ9 | Total Mag. | 45X~300X | 22.5X~150X | 33.75X~400X | 67.5X~450X | 90X~600X | 203X~1350X |
| FOV(mm) | Φ6~Φ0.9 | Φ12~Φ1.8 | Φ8~Φ1.2 | Φ4~Φ0.6 | Φ3~Φ0.45 | Φ1.3~Φ0.20 | |
| WD(mm) | 82 | 175 | 117 | 54 | 35 | 16 | |
| Main body magnification range:1.5X~10X | |||||||
| Objective | Item | CCD adapter | |
| 0.5X | 1X | ||
| 1.0X | Total optical Mag. | 0.75X~5X | 1.5X~10X |
| FOV(mm) | 4.8X6.4~0.72X0.96 | 2.4X3.2~0.36X0.48 | |
| WD(mm) | 82 | ||
| 0.5X | Total optical Mag. | 0.375X~2.5X | 0.75X~5X |
| FOV(mm) | 9.6X12.8~1.44X1.92 | 4.8X6.4~0.72X0.96 | |
| WD(mm) | 175 | ||
| 0.75X | Total optical Mag. | 0.5625X~3.75X | 1.125X~7.5X |
| FOV(mm) | 6.4X8.53~0.96X1.28 | 3.2X4.27~0.48X0.64 | |
| WD(mm) | 117 | ||
| 1.5X | Total optical Mag. | 1.125X~7.5X | 2.25X~15X |
| FOV(mm) | 3.2X4.27~0.48X0.64 | 1.6X2.13~0.24X0.32 | |
| WD(mm) | 54 | ||
| 2X | Total optical Mag. | 1.5X~10X | 3X~20X |
| FOV(mm) | 2.4X3.2~0.36X0.48 | 1.2X1.6~0.18X0.24 | |
| WD(mm) | 35 | ||
| 5X | Total optical Mag. | 3.75X~25X | 7.5X~50X |
| FOV(mm) | 0.96X1.28~0.144X0.192 | 0.48X0.64~0.072X0.096 | |
| WD(mm) | 10.1 | ||
| Zoom body magnification range 1.5X～10X | |||
| Auxiliary illuminators | MLC1000，MLR25 |
| CCD adapters | 0.4X, 0.5X, 0.67X, 1.0X(Standard outfits),1.5X,2.0X |
| Objectives | 0.3X,0.4X,0.5X,0.6X,0.75X,0.9X, |
| Infinite farness metallographic lens | Nikon, Olympus, Mitutoyo |
| Stands | SD1-D ~ SD18-D |
Probe Station Inspection: Ideal for wafer probing and electrical testing.
Semiconductor Manufacturing: Detailed inspection of micro-chips and circuits.
Material Science: Micro-surface analysis of reflective metals and glass.
Precision Measurement: High-accuracy QC for the micro-electronics industry.
A: When inspecting reflective surfaces like wafers or polished metals, standard ring lights often cause glare. A Coaxial Illumination Zoom Microscope like the MZDH15100 directs light through the optical path, providing high-contrast, shadow-free imaging that reveals tiny surface details invisible to regular lighting.
A: Yes. Our original trinocular design allows users to perform visual observation through the eyepieces while capturing high-definition video or photos via the CCD/CMOS camera interface without any light loss.
At MTscope, we understand the frustration engineers face daily: trying to solder a microscopic component while battling a microscope that leaves no room for your
As an optical engineer at Guilin Microtech (MTO), I have often observed that in the world of semiconductor and micro-CNC machining, the difference between “good”
In our years in the optical instruments industry, we’ve seen countless companies struggle with one critical decision: choosing the right microscope. This isn’t just about
What Are the Essential Functions of Microscopes in Wafer Probe Stations? Have you ever wondered what makes a microscope indispensable for wafer probe stations? In
Table of Contents 1. What Challenge Did We Face? In this case study, we explore how a Weld Seam Inspection Monocular Lens helps manufacturers ensure
We are thrilled to announce our participation in the LASER World of PHOTONICS CHINA 2025, Asia’s premier trade fair for the photonics industry. This event will
